Upendra V. Ummethala

6 Patents

• US122835032025

  Substrate Measurement Subsystem

  Applied Materials, Inc.

  0 cites
• US121911762025

  Integrated Substrate Measurement System to Improve Manufacturing Process Performance

  Applied Materials, Inc.

  0 cites
• US121365572024

  Integrated Substrate Measurement System to Improve Manufacturing Process Performance

  Applied Materials, Inc.

  0 cites
• US116930532023

  Bode Fingerprinting for Characterizations and Failure Detections in Processing Chamber

  Applied Materials, Inc.

  0 cites
• US116886162023

  Integrated Substrate Measurement System to Improve Manufacturing Process Performance

  Applied Materials, Inc.

  0 cites
• USD09775042023

  Portion of a Display Panel with a Graphical User Interface

  Applied Materials, Inc.

  0 cites