Umesh Pratap Singh

2 Patents

• US125005802025

  System and Method for Validating Critical Paths of Integrated Circuits

  NXP B.V.

  0 cites
• US121644012024

  Method and Apparatus to Inject Errors in a Memory Block and Validate Diagnostic Actions for Memory Built-in-self-test (MBIST) Failures

  NXP B.V.

  0 cites