Patents/Inventors

Umesh Chandra Srivastava

Greater NoidaIN3 patents

4 Patents

US123666052025
Area, Cost, and Time-effective Scan Coverage Improvement
Stmicroelectronics International N.V.
0 cites
US123457642025
Test Pattern Generation Using Multiple Scan Enables
STMICROELECTRONICS INTERNATIONAL N.V.
0 cites
US121469112024
TVF Transition Coverage with Self-test and Production-test Time Reduction
Stmicroelectronics International N.V.
0 cites
US117141312023
Circuit and Method for Scan Testing
Stmicroelectronics International N.V.
0 cites