Patents/Inventors

Ugo Russo

Boise, IDUS30 patents

21 Patents

US126031332026
Slow Charge Loss Monitor for Power Up Performance Boosting
Micron Technology, Inc.
0 cites
US126031382026
Partial Block Read Voltage Offset
Micron Technology, Inc.
0 cites
US125486302026
Media Management Scanning with Unified Criteria to Alleviate Fast and Latent Read Disturb
Micron Technology, Inc.
0 cites
US125016192025
Microelectronic Devices with Tunneling Structures Having Partial-height High-κ Material Regions
0 cites
US124230022025
Selectively Programming Retired Wordlines of a Memory Device
Micron Technology, Inc.
0 cites
US124170352025
Modified Read Counter Incrementing Scheme in a Memory Sub-system
Micron Technology, Inc.
0 cites
US124006882025
Assemblies Comprising Memory Cells and Select Gates; and Methods of Forming Assemblies
Micron Technology, Inc.
0 cites
US123537712025
Charge Loss Mitigation Throughout Memory Device Lifecycle by Proactive Window Shift
Micron Technolgy, Inc.
0 cites
US123267822025
Adjustment of Code Rate as Function of Memory Endurance State Metric
Micron Technology, Inc.
0 cites
US122609162025
Partial Block Handling in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US122240162025
Transient and Stable State Read Operations of a Memory Device
Micron Technology, Inc.
0 cites
US121310282024
Programming Selective Word Lines During an Erase Operation in a Memory Device
Micron Technology, Inc.
0 cites
US119830672024
Adjustment of Code Rate as Function of Memory Endurance State Metric
MICRON TECHNOLOGY, Inc.
0 cites
US119777742024
Charge Loss Mitigation Throughout Memory Device Lifecycle by Proactive Window Shift
Micron Technology, Inc.
0 cites
US119615812024
Assemblies Comprising Memory Cells and Select Gates; and Methods of Forming Assemblies
Micron Technology, Inc.
0 cites
US119220292024
Modified Read Counter Incrementing Scheme in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119250222024
Microelectronic and Semiconductor Devices with a Tunneling Structure Free of High-γ Material by a Select Gate Structure, and Related Methods
0 cites
US119010142024
Partial Block Handling in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US117766332023
Apparatus and Methods for Determining Data States of Memory Cells
Micron Technology, Inc.
0 cites
US116640792023
Intervallic Dynamic Start Voltage and Program Verify Sampling in a Memory Sub-system
Micron Technology, Inc.
0 cites
US115692552023
Void Formation in Charge Trap Structures
Micron Technology, Inc.
0 cites