5 Patents
- US123208832025Resistivity-based Adjustment of Thresholds for In-situ Monitoring
Applied Materials, Inc.
0 cites - US119392682024Low-k Material and Method for Manufacturing the Same
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites - US118475322023Machine Learning Implementation for Multi-analyte Assay Development and Testing
Freenome Holdings, Inc.
0 cites - US118110212023Precursor Structure, Lamination Film of the Same, and Manufacturing Method of Ion-conducting Layer Using the Same
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
0 cites - US116819532023Machine Learning Implementation for Multi-analyte Assay Development and Testing
Freenome Holdings, Inc.
0 cites