Tzu-chung Yang

2 Patents

• US125552652026

  Method for Defining Valid Die Positions on Inspection Wafer Map

  UNITED MICROELECTRONICS Corp.

  0 cites
• US123729302025

  Recipe Verifying Method, Recipe Verifying Server, and Smart Manufacturing Controlling System Using the Same

  UNITED MICROELECTRONICS Corp.

  0 cites