20 Patents
- US124753742025Image Processing Method, Electronic Device and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US123739282025Image Correction Method and Computing Device Utilizing Method
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US123674292025Method and Device for Optimizing Deep Learning Model Conversion, and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US122605352025Method for Detecting Defects in Images, Computer Device, and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US122605372025Defect Detection Method, Computer Device and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US122111982025Method for Detecting Defects in Divided and Further Divided Images Based on Trained Models, Electronic Device, and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US121251932024Method for Detecting Defect in Products and Electronic Device Using Method
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US121187042024Model Input Size Determination Method, Electronic Device and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US121187142024Method of Detecting and Classifying Defects and Electronic Device Using the Same
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US121125222024Defect Detecting Method Based on Dimensionality Reduction of Data, Electronic Device, and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US121125272024Method and Device for Detecting Defects, Electronic Device Using Method, and Non-transitory Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120940962024Method and Device for Detecting Defects, Electronic Device Using Method, and Non-transitory Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120677052024Method for Detecting Data Defects and Computing Device Utilizing Method
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120390152024Method for Detecting Defects in Multi-scale Images and Computing Device Utilizing Method
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120397102024Method for Improving Efficiency of Defect Detection in Images, Image Defect Detection Apparatus, and Computer Readable Storage Medium Employing Method
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120265922024Machine Learning Model Training Method and Machine Learning Model Training Device
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120204212024Image Defect Detection Method, Electronic Device Using the Same
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US120021972024Error Reduction in Reconstructed Images in Defect Detection Method, Electronic Device and Storage Medium
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US119838662024Image Defect Detection Method, Electronic Device Using the Same
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites - US115445682023Method for Optimizing a Data Model and Device Using the Same
HON HAI PRECISION INDUSTRY CO., Ltd.
0 cites