Tung-hsing Lee

2 Patents

• US124809872025

  Dynamic Voltage Stress Condition Optimization Method and Dynamic Voltage Stress Condition Optimization System Capable of Performing Block-based Dynamic Voltage Stress Wafer Testing Process

  MEDIATEK Inc.

  0 cites
• US116108392023

  Dummy Fill Structures

  GLOBALFOUNDRIES U.S. Inc.

  0 cites