24 Patents
- US125686912026BCD Device Layout Area Defined by a Deep Trench Isolation Structure and Methods for Forming the Same
Taiwan Semiconductor Manufacturing Company Limited
0 cites - US125074842025BCD Device Layout Area Defined by a Deep Trench Isolation Structure and Methods for Forming the Same
Taiwan Semiconductor Manufacturing Company Limited
0 cites - US124713292025Semiconductor Structures and Manufacturing Method Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US124023782025Semiconductor Arrangement Including First and Second Gate Electrodes and Method of Manufacture
Taiwan Semiconductor Manufacturing Company Limited
0 cites - 0 cites
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- US122665772025Deep Trench Isolation Structure and Method of Making the Same
Taiwan Semiconductor Manufacturing Company Limited
0 cites - US122119062025Method for Eliminating Divot Formation and Semiconductor Device Manufactured Using the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US121659552024Semiconductor Arrangement and Method for Making
Taiwan Semiconductor Manufacturing Company Limited
0 cites - US121145032024Integrated Chip Including a Tunnel Dielectric Layer Which Has Different Thicknesses Over a Protrusion Region of a Substrate
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US120807942024Manufacturing Method of High Voltage Semiconductor Device
UNITED MICROELECTRONICS Corp.
0 cites - 0 cites
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- US118944252024Semiconductor Arrangement and Method of Manufacture
Taiwan Semiconductor Manufacturing Company Limited
0 cites - US118549422023Semiconductor Arrangement and Method for Making
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
0 cites - US118550712023BCD Device Layout Area Defined by a Deep Trench Isolation Structure and Methods for Forming the Same
Taiwan Semiconductor Manufacturing Company Limited
0 cites - US118103002023Method for Detecting Image of Esophageal Cancer Using Hyperspectral Imaging
National Chung Cheng University
0 cites - US117988362023Semiconductor Isolation Structure and Method of Making the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US116827262023High Voltage Semiconductor Device and Manufacturing Method Thereof
UNITED MICROELECTRONICS Corp.
0 cites - US116706892023Method for Eliminating Divot Formation and Semiconductor Device Manufactured Using the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US115806372023Method for Detecting Image of Object Using Convolutional Neural Network
National Chung Cheng University
0 cites - US115750082023Semiconductor Arrangement and Method of Manufacture
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
0 cites