12 Patents
- US125638212026Semiconductor Device and Fabricating Method Thereof
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US124778182025Reduction of Damages to Source/drain Features
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US124697082025Barrier Layer for Contact Structures of Semiconductor Devices
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US124068762025Semiconductor Structure Including Isolation Structure with Dielectric Stack and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - 0 cites
- US123827012025Method of Forming Semiconductor Device Structure with Gate Structure
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites - US121487532024Semiconductor Structure and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.
0 cites - US121321112024Formation Method of Semiconductor Device Structure with Gate Stacks
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US119904162024Semiconductor Device and Method for Making the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US116827102023Structure and Formation Method of Semiconductor Device Structure with Gate Structure
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US116370182023Barrier Layer for Contact Structures of Semiconductor Devices
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites