Tsung-yang Hung

6 Patents

• US125363572026

  Systems and Methods for Modeling via Defect

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US122480222025

  Method and Apparatus for Detecting Defective Logic Devices

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US120074382024

  Method and System for Testing an Integrated Circuit

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US118526822023

  Circuit Screening System and Circuit Screening Method

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US116750042023

  Method and Apparatus for Detecting Defective Logic Devices

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US115791912023

  Method and System for Testing an Integrated Circuit

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites