10 Patents
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- US123745202025Tweezers, Conveyance Device, and Method for Conveying Sample Piece
Hitachi High-tech Corporation
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- US121761802024Method for Producing Lamella, Analysis System and Method for Analyzing Sample
Hitachi High-tech Corporation
0 cites - US121192022024Mechanism for Adjusting Angle of Incidence on Charged Particle Beam Aperture, and Charged Particle Beam Device
Hitachi High-tech Corporation
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