4 Patents
- US124943382025Electron Source, Electron Beam Device, and Method for Manufacturing Electron Source
Hitachi High-tech Corporation
0 cites - US124008232025Electron Source, Method of Manufacturing the Same, and Electron Beam Apparatus Using the Same
Hitachi High-tech Corporation
0 cites - US123858612025Charged Particle Detector, Charged Particle Ray Device, Radiation Detector, and Radiation Detection Device
HITACHI HIGH-TECH CORPORATION
0 cites - US120724542024Scintillator, Measuring Device, Mass Spectrometer, and Electron Microscope
HITACHI HIGH-TECH CORPORATION
0 cites