Patents/Inventors

Tomoyuki Iwata

AkishimaJP1 patent

2 Patents

US121751732024
Scattering Measurement Analysis Method, Scattering Measurement Analysis Device, and Non-transitory Computer-readable Storage Medium Storing Scattering Measurement Analysis Program
RIGAKU CORPORATION
0 cites
US120092852024
Substrate Having a Recessed Portion for an Electronic Component
KYOCERA CORPORATION
0 cites