Tomotaka Nagashima

2 Patents

• US120990002024

  Defect Detection Device and Defect Detection Method

  SHIMADZU CORPORATION

  0 cites
• US120553822024

  Strain Distribution Measurement System and Strain Distribution Measurement Method That Measure Strain Distribution Based on Distribution of Reflectance or Polarization Characteristic

  SHIMADZU CORPORATION

  0 cites