Patents/Inventors

Tomoki Onishi

YokohamaJP5 patents

5 Patents

US125607922026
Polarized Microscope and Intra Image Field Correction Analysis Method
Samsung Electronics Co., Ltd.
0 cites
US124396072025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US123275792025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US119398552024
Diverting Agent, Method for Temporarily Filling Fracture in Well Using Same, and Method for Further Forming Fracture
MITSUBISHI CHEMICAL CORPORATION
0 cites
US117966082023
Magnetic Property Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites