Patents/Inventors

Tomohiro Nakamichi

TokyoJP2 patents

3 Patents

US122550412025
Electron Microscope and Method of Correcting Aberration
JEOL Ltd.
0 cites
US118428802023
Estimation Model Generation Method and Electron Microscope
JEOL Ltd.
0 cites
US117640292023
Method of Measuring Aberration and Electron Microscope
JEOL Ltd.
0 cites