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Tomohiro Mimura
Aichi
JP
3 patents
3 Patents
US12614130
2026
Simulation Device
NTT DOCOMO, Inc.
0 cites
US12535432
2026
Manufacturing Method and Inspection Method of Semiconductor Device Including Obtaining an Image of the Device and Determining Defects of a Metal Electrode
DENSO CORPORATION
0 cites
US11967564
2024
Method for Manufacturing Semiconductor Device
DENSO CORPORATION
0 cites