Patents/Inventors

Tomas Vystavel

BrnoCZ3 patents

3 Patents

US125801502026
Systems and Methods for Analyzing a Sample Using Charged Particle Beams and Active Pixel Control Sensors
FEI Company
0 cites
US121069312024
Systems and Methods for Pre-aligning Samples for More Efficient Processing of Multiple Samples with a Broad Ion Beam (BIB) System
FEI COMPANY
0 cites
US116501712023
Offcut Angle Determination Using Electron Channeling Patterns
FEI Company
0 cites