Patents/Inventors

Todd M Dunford

Amherst, MAUS7 patents

8 Patents

US123599452025
Measurement System and Method of Use
JENTEK Sensors, Inc.
0 cites
US122534922025
In-process Quality Assessment for Additive Manufacturing
JENTEK Sensors, Inc.
0 cites
US119598802024
Method and Apparatus for Measurement of Material Condition
JENTEK Sensors, Inc.
0 cites
US118412452023
Measurement System and Method of Use
JENTEK Sensors, Inc.
0 cites
US118028512023
Segmented Field Eddy Current Sensing for Dispersive Property Measurement and Complex Structures
JENTEK Sensors, Inc.
0 cites
US117473042023
In-process Quality Assessment for Additive Manufacturing
JENTEK Sensors, Inc.
0 cites
US115498312023
Measurement System and Method of Use
JENTEK Sensors, Inc.
0 cites
US115433882023
In-process Quality Assessment for Additive Manufacturing
JENTEK Sensors, Inc.
0 cites