Patents/Inventors

Todd J. Egan

Fremont, CAUS9 patents

9 Patents

US122764902025
System and Method to Map Thickness Variations of Substrates in Manufacturing Systems
Applied Materials, Inc.
0 cites
US122653772025
Autonomous Substrate Processing System
Applied Materials, Inc.
0 cites
US122258082025
In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites
US120989142024
Surface Roughness and Emissivity Determination
Applied Materials, Inc.
0 cites
US120625832024
Optical Metrology Models for In-line Film Thickness Measurements
Applied Materials Israel Ltd.
0 cites
US120026652024
Real-time Detection of Particulate Matter During Deposition Chamber Manufacturing
Applied Materials, Inc.
0 cites
US118568332023
In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites
US117094772023
Autonomous Substrate Processing System
Applied Materials, Inc.
0 cites
US116091832023
Methods and Systems to Measure Properties of Products on a Moving Blade in Electronic Device Manufacturing Machines
Applied Materials, Inc.
0 cites