Patents/Inventors

Todd Egan

Fremont, CAUS8 patents

7 Patents

US124928902025
In-situ Reflectometry for Real-time Process Control
Applied Materials, Inc.
0 cites
US119275352024
Metrology for OLED Manufacturing Using Photoluminescence Spectroscopy
Applied Materials, Inc.
0 cites
US119087162024
Image-based In-situ Process Monitoring
Applied Materials, Inc.
0 cites
US118982492024
PECVD Process
Applied Materials, Inc.
0 cites
US119012032024
Substrate Process Endpoint Detection Using Machine Learning
Applied Materials, Inc.
0 cites
US116623172023
Metrology for OLED Manufacturing Using Photoluminescence Spectroscopy
Applied Materials, Inc.
0 cites
US116138122023
PECVD Process
Applied Materials, Inc.
0 cites