Patents/Inventors

Tobias Gnausch

JenaDE2 patents

3 Patents

US122100572025
Wafer-level Test Method for Optoelectronic Chips
Jenoptik Optical Systems GmbH
0 cites
US122039832025
Contacting Module for Contacting Optoelectronic Chips
JENOPTIK Optical Systems GmbH
0 cites
US119065792024
Wafer-level Test Method for Optoelectronic Chips
JENOPTIK GmbH
0 cites