Patents/Inventors

Tjerk Gerrit Spanjer

EindhovenNL2 patents

3 Patents

US121761792024
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites
US118172902023
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites
US115877592023
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites