Patents/Inventors

Tingjun Xie

Milpitas, CAUS62 patents

54 Patents

US126145932026
Managing Allocation of Blocks in a Memory Sub-system
Micron Technology, Inc.
0 cites
US126145962026
Enhanced Combination Scan Management for Block Families of a Memory Device
Micron Technology, Inc.
0 cites
US126031442026
Block Health Detector for Block Retirement in a Memory Sub-system
Micron Technology, Inc.
0 cites
US125723112026
Managing Write Disturb Based on Identification of Frequently-written Memory Units
Micron Technology, Inc.
0 cites
US125544242026
Power-off Monitor for Relaxed Block Retirement in a Memory Sub-system
Micron Technology, Inc.
0 cites
US125413982026
Management of Unmapped Allocation Units of a Memory Sub-system
Micron Technology, Inc.
0 cites
US124888282025
Efficient Periodic Backend Refresh Reads for Reducing Bit Error Rate in Memory Devices
Micron Technology, Inc.
0 cites
US124825252025
Apparatus with Multi-deck Read Level Management and Methods for Operating the Same
Micron Technology, Inc.
0 cites
US124511892025
Partial Block Handling Protocol in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US123866892025
Prioritization of Successful Read Recovery Operations for a Memory Device
Micron Technology, Inc.
0 cites
US123731112025
Monitoring Memory Device Health According to Data Storage Metrics
Micron Technology, Inc.
0 cites
US123331542025
Reducing Bit Error Rate in Memory Devices
Micron Technology, Inc.
0 cites
US122177942025
Managing the Programming of an Open Translation Unit
Micron Technology, Inc.
0 cites
US122107522025
Managing a Hybrid Error Recovery Process in a Memory Sub-system
Micron Technology, Inc.
0 cites
US121834062024
Eliminating Write Disturb for System Metadata in a Memory Sub-system
Micron Technology, Inc.
0 cites
US121657092024
Memory Cell Voltage Level Selection
Micron Technology, Inc.
0 cites
US120508082024
Selecting a Write Operation Mode from Multiple Write Operation Modes
Micron Technology, Inc.
0 cites
US120455122024
Read Refresh via Signal Calibration for Non-volatile Memories
Micron Technology, Inc.
0 cites
US120272112024
Partial Block Handling Protocol in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US119949452024
Managing Write Disturb for Units of Memory in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119891072024
Application of Dynamic Trim Strategy in a Die-protection Memory Sub-system
Micron Technology, Inc.
0 cites
US119665912024
Apparatus with Read Level Management and Methods for Operating the Same
Micron Technology, Inc.
0 cites
US119539732024
Prioritization of Successful Read Recovery Operations for a Memory Device
Micron Technology, Inc.
0 cites
US119230012024
Managing the Programming of an Open Translation Unit
Micron Technology, Inc.
0 cites
US119148892024
Managing an Adjustable Write-to-read Delay Based on Cycle Counts in a Memory Sub-system
Micron Technology, Inc.
0 cites
US118940902024
Selective Power-on Scrub of Memory Units
Micron Technology, Inc.
0 cites
US118611782024
Managing a Hybrid Error Recovery Process in a Memory Sub-system
Micron Technology, Inc.
0 cites
US118536172023
Managing Write Disturb Based on Identification of Frequently-written Memory Units
Micron Technology, Inc.
0 cites
US118373032023
Optimizing Memory Access Operation Parameters
Micron Technology, Inc.
0 cites
US117909982023
Eliminating Write Disturb for System Metadata in a Memory Sub-system
Micron Technology, Inc.
0 cites
US117753882023
Defect Detection in Memory Based on Active Monitoring of Read Operations
Micron Technology, Inc.
0 cites
US117625892023
Dynamic Read-level Thresholds in Memory Systems
Micron Technology, Inc.
0 cites
US117566352023
Decision for Executing Full-memory Refresh During Memory Sub-system Power-on Stage
Micron Technology, Inc.
0 cites
US117420292023
Adjusting Read-level Thresholds Based on Write-to-write Delay
Micron Technology, Inc.
0 cites
US117352842023
Optimized Seasoning Trim Values Based on Form Factors in Memory Sub-system Manufacturing
Micron Technology, Inc.
0 cites
US117340942023
Memory Component Quality Statistics
Micron Technology, Inc.
0 cites
US117097332023
Metadata-assisted Encoding and Decoding for a Memory Sub-system
Micron Technology, Inc.
0 cites
US116940172023
Temperature-based on Board Placement of Memory Devices
Micron Technology, Inc.
0 cites
US116937362023
Modifying Conditions for Memory Device Error Corrections Operations
Micron Technology, Inc.
0 cites
US116884852023
Self-adaptive Read Voltage Adjustment Using Boundary Error Statistics for Memories with Time-varying Error Rates
Micron Technology, Inc.
0 cites
US116872482023
Life Time Extension of Memory Device Based on Rating of Individual Memory Units
Micron Technology, Inc.
0 cites
US116884672023
Defect Detection in Memories with Time-varying Bit Error Rate
Micron Technology, Inc.
0 cites
US116569362023
Managing Write Disturb for Units of Memory in a Memory Sub-system
Micron Technology, Inc.
0 cites
US116518342023
Memory Duty-cycle Skew Management
Micron Technology, Inc.
0 cites
US116321372023
Early Decoding Termination for a Memory Sub-system
Micron Technology, Inc.
0 cites
US116261822023
Selective Power-on Scrub of Memory Units
Micron Technology, Inc.
0 cites
US116261802023
Memory Degradation Detection and Management
Micron Technology, Inc.
0 cites
US116158302023
Performing a Refresh Operation Based on a Characteristic of a Memory Sub-system
Micron Technology, Inc.
0 cites
US116003152023
Performing a Refresh Operation Based on System Characteristics
Micron Technology, Inc.
0 cites
US115798092023
Performing a Refresh Operation Based on a Write to Read Time Difference
Micron Technology, Inc.
0 cites
US115617262023
Read Refresh via Signal Calibration for Non-volatile Memories
MICRON TECHNOLOGY, Inc.
0 cites
US115617342023
Selecting Read Voltage Using Write Transaction Data
MICRON TECHNOLOGY, Inc.
0 cites
US115573622023
Optimizing Memory Access Operation Parameters
Micron Technology, Inc.
0 cites
US115506632023
Changing of Error Correction Codes Based on the Wear of a Memory Sub-system
MICRON TECHNOLOGY, Inc.
0 cites