Ting-hao Hsu

8 Patents

• US124297762025

  Lithography Method with Reduced Impacts of Mask Defects

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US123931242025

  High Throughput and High Position Accurate Method for Particle Inspection of Mask Pods

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US121408572024

  Method of Fast Surface Particle and Scratch Detection for EUV Mask Backside

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US120136462024

  High Throughput and High Position Accurate Method for Particle Inspection of Mask Pods

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US118550992023

  Metal-insulator-semiconductor Tunnel Diode Memory

  NATIONAL TAIWAN UNIVERSITY

  0 cites
• US117684312023

  Method of Fast Surface Particle and Scratch Detection for EUV Mask Backside

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US117220992023

  Semiconductor Device and Operation Method Thereof

  NATIONAL TAIWAN UNIVERSITY

  0 cites
• US116146912023

  High Throughput and High Position Accurate Method for Particle Inspection of Mask Pods

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites