Tianrong Zhan

3 Patents

• US125467272026

  Calibration of Parametric Measurement Models Based on In-line Wafer Measurement Data

  KLA Corporation

  0 cites
• US123796722025

  Metrology of Nanosheet Surface Roughness and Profile

  KLA Corporation

  0 cites
• US120855152024

  Methods and Systems for Selecting Wafer Locations to Characterize Cross-wafer Variations Based on High-throughput Measurement Signals

  KLA Corporation

  0 cites