4 Patents
- US123884662025Method and Apparatus for Testing Error Correcting Code (ECC) Function of FPGA On-chip Block Random Access Memory (BRAM)
GOWIN Semiconductor Corporation, Ltd.
0 cites - US123409382025110 Kv Three-phase Dry-type Transformer and Assembly Method Therefor
Jiangsu Huapeng Transformer Co., Ltd.
0 cites - US120387812024Method and System for Organizing Programmable Semiconductor Device Into Multiple Clock Regions
GOWIN SEMICONDUCTOR CORPORATION
0 cites - US116147702023Methods and Apparatus for Organizing a Programmable Semiconductor Device Into Multiple Clock Regions
GOWIN SEMICONDUCTOR CORPORATION
0 cites