Thomas Jarik Huisman

4 Patents

• US125671642026

  Apparatus and Method for Determining Three Dimensional Data Based on an Image of a Patterned Substrate

  ASML NETHERLANDS B.V.

  0 cites
• US122550422025

  Numerically Compensating Sem-induced Charging Using Diffusion-based Model

  ASML Netherlands B.V.

  0 cites
• US117336142023

  Method of Metrology and Associated Apparatuses

  ASML Netherlands B.V.

  0 cites
• US116686612023

  Inspection Tool and Inspection Method

  ASML Netherlands B.V.

  0 cites