Patents/Inventors

Thomas Gentner

BoeblingenDE2 patents

3 Patents

US122924722025
Testing a Single Chip in a Wafer Probing System
International Business Machines Corporation
0 cites
US118088082023
Testing a Single Chip in a Wafer Probing System
International Business Machines Corporation
0 cites
US115746952023
Logic Built-in Self-test of an Electronic Circuit
International Business Machines Corporation
0 cites