Patents/Inventors

Te-ming Kung

TaichungTW7 patents

8 Patents

US124647902025
Semiconductor Structure
NATIONAL CHENG KUNG UNIVERSITY
0 cites
US122766982025
Testing System and Testing Method
Asmedia Technology Inc.
0 cites
US122241792025
Metal Heterojunction Structure with Capping Metal Layer
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US121815362024
Testing Circuit for Testing Universal Serial Bus
Asmedia Technology Inc.
0 cites
US121583322024
Thin Film Metrology
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US120211172024
Semiconductor Structure and Method of Forming the Same
NATIONAL CHENG KUNG UNIVERSITY
0 cites
US117617512023
Thin Film Metrology
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US116370212023
Metal Heterojunction Structure with Capping Metal Layer
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites