Patents/Inventors

Te-kun Lin

TainanTW3 patents

3 Patents

US124295012025
Method for Detecting Contact Force of Probe Card
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US123264632025
Probe Card Needle Shape and Method of Manufacturing
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US120555632024
Probe Card, Apparatus and Method for Detecting Contact Force of Probe Card
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites