3 Patents
- US124881712025Through Silicon via Macro with Dense Layout for Placement in an Integrated Circuit Floorplan
Advanced Micro Devices, Inc.
0 cites - US123396322025Training Method for Semiconductor Process Prediction Model, Semiconductor Process Prediction Device, and Semiconductor Process Prediction Method
UNITED MICROELECTRONICS Corp.
0 cites - US116098362023Operation Method and Operation Device of Failure Detection and Classification Model
UNITED MICROELECTRONICS Corp.
0 cites