Te-chih Huang

4 Patents

• US121966872025

  Method for Inspecting Pattern Defects

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US120558602024

  Multi-function Overlay Marks for Reducing Noise and Extracting Focus and Critical Dimension Information

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US118358642023

  Multi-function Overlay Marks for Reducing Noise and Extracting Focus and Critical Dimension Information

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US116249852023

  Methods of Defect Inspection

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites