21 Patents
- US124682212025Imprint Apparatus for Forming a Pattern of an Imprint Material on a Substrate-side Pattern Region of a Substrate by Using a Mold, and Related Device Manufacturing Methods
CANON KABUSHIKI KAISHA
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- US122777232025Electromagnetic Environment Analysis System, Electromagnetic Environment Analysis Method, and Non-transitory Computer-readable Medium
TDK CORPORATION
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- US121533432024Imprint Method, Imprint Apparatus, and Article Manufacturing Method
CANON KABUSHIKI KAISHA
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- US120992952024Imprint Apparatuses and Article Manufacturing Methods Applying Viscosity Increases Without Curing of Imprint Material
Canon Kabushiki Kaisha
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- US120858502024Imprint Apparatus, Imprint Method, and Article Manufacturing Method
CANON KABUSHIKI KAISHA
0 cites - US120555742024Electromagnetic Environment Analysis System, Electromagnetic Environment Analysis Method, and Non-transitory Computer-readable Medium
TDK CORPORATION
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- US119936902024Polyamide-based Resin Expanded Beads and Molded Article of Polyamide-based Resin Expanded Beads
JSP CORPORATION
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- US117091922023Electromagnetic Environment Analysis System, Electromagnetic Environment Analysis Method, and Non-transitory Computer-readable Medium
TDK CORPORATION
0 cites - US116140702023Vertical Axis Wind Turbine, and Wind Power Generating Device and Lighting Facility Comprising Same
NTN CORPORATION
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