Takuya Tamano

4 Patents

• US123945012025

  Apparatus with Adjustable Diagnostic Mechanism and Methods for Operating the Same

  Micron Technology, Inc.

  0 cites
• US121004672024

  Systems and Methods for Testing Redundant Fuse Latches in a Memory Device

  Micron Technology, Inc.

  0 cites
• US121004762024

  Test Mode Security Circuit

  Micron Technology, Inc.

  0 cites
• US117910112023

  Self-repair Verification

  Micron Technology, Inc.

  0 cites