Patents/Inventors

Takuya Kambayashi

TokyoJP5 patents

6 Patents

US123990632025
Spectroscopic Analysis System and Spectroscopic Analysis Method
HITACHI HIGH-TECH ANALYSIS CORPORATION
0 cites
US123392102025
Particle Measuring Device
HITACHI, Ltd.
0 cites
US122982272025
Optical Analysis System and Control Method of Optical Analysis System
Hitachi, Ltd.
0 cites
US122593152025
Ultrasonic Transducer Holder, Container, and Analysis System Using Same
HITACHI HIGH-TECH CORPORATION
0 cites
US122418262025
Optical Measurement Instrument, Server Device, and Optical Measurement Method
Hitachi, Ltd.
0 cites
US115669782023
System Providing an Ultrasonic Pretreatment for Separating Particles from an Analysis Sample
Hitachi, Ltd.
0 cites