15 Patents
- US125295562026Thickness Measuring Device and Thickness Measuring Method to Measure Thickness of Substrate
Tokyo Electron Limited
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- US118374872023Transfer Device, Substrate Processing System, Transfer Method and Substrate Processing Method
Tokyo Electron Limited
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- US117698632023Light Emitting Device, Method of Manufacturing Light Emitting Device, Planar Light Source, and Liquid Crystal Display Device
NICHIA CORPORATION
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