13 Patents
- US125115742025Processing Condition Search Device and Processing Condition Search Method
Hitachi, Ltd.
0 cites - US124505202025Experiment Point Recommendation Device, Experiment Point Recommendation Method, and Semiconductor Device Manufacturing Device
Hitachi High-tech Corporation
0 cites - US124379592025Charged Particle Beam Device, and Sample Observation Method Employing Same
Hitachi, Ltd.
0 cites - US123455222025Computer System, Dimension Measurement Method, and Storage Medium
Hitachi High-tech Corporation
0 cites - US123206302025Dimension Measurement Apparatus, Semiconductor Manufacturing Apparatus, and Semiconductor Device Manufacturing System
Hitachi High-tech Corporation
0 cites - US122226902025Process Recipe Search Apparatus, Etching Recipe Search Method and Semiconductor Device Manufacturing System
Hitachi High-tech Corporation
0 cites - US120941462024Contour Analysis Apparatus, Processing Condition Determination System, Shape Estimation System, Semiconductor Device Manufacturing System, Search Apparatus, and Data Structure Used in Them
HITACHI HIGH-TECH CORPORATION
0 cites - 0 cites
- US117477742023Search Device, Search Program, and Plasma Processing Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites - 0 cites
- US116570592023Search Device, Searching Method, and Plasma Processing Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites - US116091882023Processing Condition Determination System and Processing Condition Searching Method
HITACHI, Ltd.
0 cites - US116005362023Dimension Measurement Apparatus, Dimension Measurement Program, and Semiconductor Manufacturing System
HITACHI HIGH-TECH CORPORATION
0 cites