Patents/Inventors

Takeru Oohashi

TokyoJP2 patents

2 Patents

US118337482023
Apparatus for Producing Three-dimensional Multilayer Model, Method for Producing Three-dimensional Multilayer Model, and Flaw Detector
IHI Corporation
0 cites
US117668242023
Apparatus for Producing Three-dimensional Multilayer Model, Method for Producing Three-dimensional Multilayer Model, and Flaw Detector
IHI Corporation
0 cites