Patents/Inventors

Takehiro Tsunemori

TokyoJP2 patents

2 Patents

US125605542026
Silicon Wafer Defect Inspection Method and Silicon Wafer Defect Inspection System
SUMCO CORPORATION
0 cites
US121070182024
Method of Measuring Concentration of Fe in P-type Silicon Wafer and SPV Measurement Apparatus
SUMCO CORPORATION
0 cites