Patents/Inventors

Takashi Hiroi

TokyoJP2 patents

3 Patents

US121129632024
Defect Inspection Apparatus and Defect Inspection Program
Hitachi High-tech Corporation
0 cites
US120397162024
Defect Inspection Method and Defect Inspection Device
Hitachi High-tech Corporation
0 cites
US117889732023
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites