Patents/Inventors

Takanori Murano

TokyoJP3 patents

4 Patents

US117889762023
X-ray Measurement Apparatus and X-ray Measurement Method
JEOL Ltd.
0 cites
US116995672023
X-ray Detection Apparatus and Method
JEOL Ltd.
0 cites
US116749132023
Sample Analysis Apparatus and Method
JEOL Ltd.
0 cites
US116686622023
Sample Analysis Apparatus and Method
JEOL Ltd.
0 cites