Patents/Inventors

Takahiro Urano

TokyoJP4 patents

5 Patents

US122352232025
Method for Defect Inspection, System, and Computer-readable Medium
Hitachi High-tech Corporation
0 cites
US121129632024
Defect Inspection Apparatus and Defect Inspection Program
Hitachi High-tech Corporation
0 cites
US120397162024
Defect Inspection Method and Defect Inspection Device
Hitachi High-tech Corporation
0 cites
US119812022024
Accelerator Pedal Device
MIKUNI CORPORATION
0 cites
US117889732023
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites