Patents/Inventors

Takafumi Higuchi

HamamatsuJP28 patents

23 Patents

US125746622026
Threshold Value Determination Method, Threshold Value Determination Program, Threshold Value Determination Device, Photon Number Identification System, Photon Number Identification Method, and Photon Number Identification Processing Program
HAMAMATSU PHOTONICS K.K.
0 cites
US125677232026
Light-emitting Device, Optical Device, and Information Processing Device
FUJIFILM Business Innovation Corp.
0 cites
US125373612026
Light-emitting Component, Light-emitting Element Array Chip, and Optical Measurement Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US125313922026
Light Emitting Device and Measurement Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US125134322025
Photon Counting Device, Photon Counting Method, and Photon Counting Processing Program
HAMAMATSU PHOTONICS K.K.
0 cites
US125003892025
Light-emitting Component, Light-emitting Element Array Chip, and Optical Measurement Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US124817372025
Light Emitter, Light Emitting Device, Optical Device, and Information Processing Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US124764392025
Light-emitting Component, Light-emitting Element Array Chip, and Optical Measurement Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US124181612025
Light Emitting Apparatus and Information Processing Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US123600562025
Semiconductor Apparatus Examination Method and Semiconductor Apparatus Examination Apparatus
HAMAMATSU PHOTONICS K.K.
0 cites
US122111992025
Method for Inspecting Semiconductor and Semiconductor Inspecting Device
HAMAMATSU PHOTONICS K.K.
0 cites
US121322952024
Light-emitting Device, Optical Device, Measuring Device, and Information Processing Device
FUJIFILM Business Innovation Corp.
0 cites
US120941382024
Semiconductor Inspection Device and Semiconductor Inspection Method
HAMAMATSU PHOTONICS K.K.
0 cites
US120787672024
Photon Counting Device and Photon Counting Method
HAMAMATSU PHOTONICS K.K.
0 cites
US120447292024
Semiconductor Device Examination Method and Semiconductor Device Examination Device
HAMAMATSU PHOTONICS K.K.
0 cites
US119212452024
Photon Counting Device and Photon Counting Method
HAMAMATSU PHOTONICS K.K.
0 cites
US118356672023
Photon Counting Device and Photon Counting Method
HAMAMATSU PHOTONICS K.K.
0 cites
US117966922023
Photon Counting Device and Photon Counting Method
HAMAMATSU PHOTONICS K.K.
0 cites
US117992692023
Light Emitting Element
FUJIFILM Business Innovation Corp.
0 cites
US117092842023
Photon Counting Device and Photon Counting Method
HAMAMATSU PHOTONICS K.K.
0 cites
US116563742023
Photon Counting Device and Photon Counting Method
HAMAMATSU PHOTONICS K.K.
0 cites
US116571302023
Light Emitter, Light Emitting Device, Optical Device, and Information Processing Apparatus
FUJIFILM Business Innovation Corp.
0 cites
US115996102023
Light-emitting Device, Optical Device, and Information Processing Apparatus
FUJIFILM Business Innovation Corp.
0 cites