Patents/Inventors

Taichi Tanaka

TokyoJP22 patents

13 Patents

US126028332026
Image Analysis Device and Image Analysis Method
NEC CORPORATION
0 cites
US125784582026
Signal Processing Device, Signal Processing Method, and Recording Medium
NEC CORPORATION
0 cites
US125540092026
Image Analysis Device and Image Analysis Method
NEC CORPORATION
0 cites
US123992692025
Image Analyzing Device and Image Analyzing Method
NEC Corporation
0 cites
US122535902025
Object Detection Apparatus, Object Detection Method, and Computer-readable Recording Medium
NEC CORPORATION
0 cites
US120856662024
Radar Device, Imaging Method, and Imaging Program
NEC CORPORATION
0 cites
US119338852024
Radar Signal Imaging Device, Radar Signal Imaging Method, and Radar Signal Imaging Program
NEC CORPORATION
0 cites
US118467022023
Image Processing Device and Image Processing Method
NEC CORPORATION
0 cites
US118414212023
Synthetic Aperture Radar Image Analysis System, Synthetic Aperture Radar Image Analysis Method, and Synthetic Aperture Radar Image Analysis Program
NEC CORPORATION
0 cites
US118414222023
Synthetic Aperture Radar Signal Processing Device and Signal Processing Method
NEC CORPORATION
0 cites
US118356192023
Synthetic Aperture Radar Signal Analysis Device, Synthetic Aperture Radar Signal Analysis Method, and Synthetic Aperture Radar Signal Analysis Program
0 cites
US117547042023
Synthetic-aperture-radar Image Processing Device and Image Processing Method
NEC CORPORATION
0 cites
US117092542023
SAR Image Analysis System, Image Processing Apparatus, Image Processing Method, and Image Processing Program
NEC CORPORATION
0 cites