Patents/Inventors

Taewook Park

Suwon-siKR4 patents

5 Patents

US124999612025
Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites
US123341702025
Operating and Testing Semiconductor Devices
Samsung Electronics Co., Ltd.
0 cites
US121694192024
Clock Generating Circuit and Method for Trimming Period of Oscillator Clock Signal
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US121643762024
Storage Device Including Mapping Memory and Method of Operating the Same
Samsung Electronics Co., Ltd.
0 cites
US118042762023
Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites