Patents/Inventors

Taejoong Kim

Suwon-siKR5 patents

5 Patents

US125781782026
Pupil Image Measuring Device and Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124811442025
EUV Photomask Inspection Apparatus
Samsung Electronics Co., Ltd.
0 cites
US123680652025
Wafer Processing Apparatus
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US116685582023
Thickness Estimation Method and Processing Control Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US115790962023
Wafer Inspection Apparatus and Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites