Tae Won Park

8 Patents

• US125529622026

  CMP Slurry Composition for Polishing Tungsten Pattern Wafer and Method of Polishing Tungsten Pattern Wafer Using the Same

  SAMSUNG SDI CO., Ltd.

  0 cites
• US124604052025

  Method for Horizontal Leveling Coupling Between Concrete Foundation and Wooden Vertical Beams

  INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOK UNIVERSITY

  0 cites
• US124279442025

  Control Method for Deploying Airbag

  HYUNDAI MOBIS CO., Ltd.

  0 cites
• US121396422024

  CMP Slurry Composition for Polishing Tungsten Pattern Wafer and Method of Polishing Tungsten Pattern Wafer Using the Same

  SAMSUNG SDI CO., Ltd.

  0 cites
• US120175972024

  Control Device and Method for Controlling Passenger Protection Device

  Hyundai Mobis Co., Ltd.

  0 cites
• US119134132024

  Air Intake System of Engine

  FEV Europe GmbH

  0 cites
• US115604952023

  CMP Slurry Composition for Polishing Tungsten Pattern Wafer and Method of Polishing Tungsten Pattern Wafer Using the Same

  SAMSUNG SDI CO., Ltd.

  0 cites
• US115428552023

  PCJ Solenoid Valve Diagnostic Method

  Kia Corporation

  0 cites