Patents/Inventors

Tadashi Okuno

OkayamaJP2 patents

3 Patents

US121741132024
Photoresist Characteristics Analysis Method and Characteristics Analysis Device
FEMTO Deployments Inc.
0 cites
US120722852024
Measuring Jig, and Calibration Method and Terahertz Wave Measuring Method Using Same
FEMTO Deployments Inc.
0 cites
US116808962023
Electromagnetic Signal Analysis Apparatus and Electromagnetic Signal Analysis Program
FEMTO DEPLOYMENTS Inc.
0 cites